James Yiu
About James Yiu
James Yiu is a Wireless Test Engineer currently employed at Alif Semiconductor since 2022. He has over a decade of experience in various engineering roles, including positions at Jariet Technologies, QuinStar Technology, and Northrop Grumman.
Work at Alif Semiconductor
James Yiu currently holds the position of Wireless Test Engineer at Alif Semiconductor. He has been with the company since 2022, contributing to the development and testing of wireless technologies. His role involves ensuring the performance and reliability of wireless systems, which is critical for the company's product offerings.
Previous Experience in Wireless Engineering
Before joining Alif Semiconductor, James Yiu worked at GOODIX Technology INC. as a Senior Staff Wireless PHY DVT Engineer for one year from 2021 to 2022. He also served as a Senior ATE Test Engineer at Northrop Grumman from 2020 to 2021. His extensive background includes a significant tenure at Jariet Technologies, Inc. as a Senior Analog Mixed Signal/DSP Validation Engineer from 2017 to 2020, and at QuinStar Technology Inc. as a Senior MMIC DVT Engineer from 2011 to 2016.
Education and Expertise
James Yiu earned both his Bachelor's and Master's degrees in Electrical Engineering from the University of California, Irvine. He completed his Bachelor's degree from 2003 to 2005 and his Master's degree from 2005 to 2007. His academic background provides a strong foundation for his career in wireless engineering and technology.
Career at Broadcom
James Yiu worked at Broadcom as an RFIC DVT Engineer from 2007 to 2010. During his three years at Broadcom, he focused on the development and validation of RF integrated circuits, contributing to the company's advancements in wireless communication technologies.