Armantas Melianas
About Armantas Melianas
Armantas Melianas is a Senior Scientist specializing in thin-film analysis and reverse engineering of optoelectronic devices. He has a strong academic background with degrees from Vilnius University and Linköping University, and he currently works at Exponent in Menlo Park, California.
Work at Exponent
Armantas Melianas has been employed at Exponent as a Senior Scientist since 2022. His role involves conducting optical safety testing for virtual reality and augmented reality headsets, lasers, and LEDs, adhering to IEC 60825 and IEC 62471 standards. Prior to his current position, he worked as a Scientist at Exponent from 2021 to 2022, where he contributed to various projects related to optical safety and failure analysis.
Education and Expertise
Armantas Melianas holds a Master of Science in Materials Technology from Vilnius University, where he studied from 2010 to 2012. He also earned a Bachelor of Science in Physics from the same institution, completing his studies from 2006 to 2010. He obtained a Ph.D. in Applied Physics from Linköping University, studying from 2012 to 2017. Additionally, he completed the Stanford Ignite Certificate Program in Innovation and Entrepreneurship at Stanford University Graduate School of Business in 2020.
Background
Melianas began his academic journey at Vilnius University, where he studied Physics. He then pursued advanced studies at Linköping University, culminating in a Ph.D. in Applied Physics. His professional experience includes a Doctoral Student position at Linköping University from 2012 to 2017 and a Wallenberg Postdoctoral Fellowship at Stanford University from 2017 to 2021. He also served as a Visiting Researcher at Stanford University for three months in 2016.
Achievements
In his professional capacity, Armantas Melianas specializes in thin-film analysis and reverse engineering of optoelectronic devices. He employs various techniques, including etching, scanning electron microscopy (SEM), focused ion beam (FIB), and atomic force microscopy (AFM). His work encompasses failure analysis using advanced microscopy, X-rays, and computer tomography (CT), as well as optical safety simulations for eye-tracking systems in VR/AR headsets.