Charles Song

Charles Song

Senior Principal Test Engineer @ Ampere

About Charles Song

Charles Song is a Senior Principal Test Engineer currently working at Ampere in Santa Clara, California. He has a diverse background in test engineering, having held various positions at companies such as Cisco, Oracle, and CSR, with extensive experience in test hardware design and ATE test programming.

Current Role at Ampere

Charles Song currently serves as a Senior Principal Test Engineer at Ampere, a position he has held since 2022. He works on-site in Santa Clara, California. In this role, he leverages his extensive experience in test engineering to enhance product quality and reliability.

Previous Experience at Ampere

Prior to his current role, Charles worked at Ampere as a Principal Test Engineer from 2019 to 2022. During this three-year tenure, he contributed to various testing initiatives and played a key role in improving testing processes and methodologies.

Professional Background

Charles has a diverse professional background in test engineering, having worked at several notable companies. He was a Sr Test Engineer at Cisco from 2018 to 2019, and prior to that, he held positions at Integrated Device Technology, Inc. and CSR, among others. His experience spans multiple locations, including the San Francisco Bay Area and Shanghai.

Education and Expertise

Charles studied Signal Processing at Tongji University, where he earned a Master’s degree from 1999 to 2002. He also studied at Yezhai. His educational background complements his extensive expertise in designing test hardware fixtures and writing ATE test programs, particularly with Advantest and Teradyne testers.

Technical Skills and Contributions

Charles possesses strong technical skills in writing scripts and tools for pattern conversion, data extraction, and data analysis. His work has contributed to test time reduction and yield improvements. He is also familiar with using various bench equipment for testing and validation, and has a deep understanding of Design for Testability (DFT) for both digital and analog circuits.

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