Simon Alcock
About Simon Alcock
Simon Alcock is a Senior Metrology Scientist at Diamond Light Source, where he has worked since 2003. He specializes in developing metrology instruments and strategies for X-ray optics and nano-positioning systems.
Work at Diamond Light Source
Simon Alcock has served as a Senior Metrology Scientist at Diamond Light Source since 2003. In this role, he focuses on developing metrology instruments and measurement strategies specifically for characterizing advanced X-ray optics and nano-positioning systems utilized in synchrotron beamlines. His work is essential for enhancing the precision of X-ray optics and contributes to the overall performance of synchrotron facilities.
Education and Expertise
Simon Alcock studied at the University of Leicester, where he earned both his MPhys and PhD in Physics from 1994 to 2003. His academic background provides a strong foundation for his expertise in metrology, particularly in the context of X-ray optics and precision measurement techniques.
Research Contributions
Alcock authored a paper titled 'Nano-metrology: The art of measuring X-ray mirrors with slope errors <100 nrad,' published in the Review of Scientific Instruments in 2016. This work highlights his contributions to the field of nano-metrology and reflects his ongoing commitment to advancing measurement techniques for X-ray optics.
Involvement in International Projects
Simon Alcock participates in the Calipso-plus international project, specifically contributing to the Metrology On One-Nanometer-Precise Optics (MooNpics) initiative. His involvement in this project underscores his role in advancing metrology techniques on an international scale, particularly in achieving high precision in mirror fabrication.
Advancements in Mirror Metrology
Alcock contributes to the advancement of mirror metrology in Europe, aiming to achieve single-nanometer figure error and 20 nrad rms slope error precision. His efforts are significant for the development of high-performance X-ray optics, which are critical for various scientific applications.