Anna Cortona
About Anna Cortona
Anna Cortona is a patent examiner specializing in laser technology and optics, currently working at the European Patent Office since 2003. She has a background in Applied Physics and General Physics, holding a Master's degree from Università degli Studi di Torino and a PhD from TU Vienna.
Work at European Patent Office
Anna Cortona has been employed as a patent examiner at the European Patent Office (EPO) since 2003. Over her 21-year tenure, she has specialized in the examination of patents related to laser technology and optics. In her role, she conducts oral proceedings in various capacities, including serving as a chairman. Her responsibilities include the search and examination of both European and PCT applications, contributing to the EPO's mission of ensuring the quality and accuracy of patent grants.
Education and Expertise
Anna Cortona holds a Master in Physics from Università degli Studi di Torino, where she studied Applied Physics from 1990 to 1995. She further advanced her education at TU Vienna, earning a Doctor of Philosophy (PhD) in General Physics from 1996 to 1999. Her academic background provides a solid foundation for her expertise in patent examination, particularly in the fields of laser technology and optics.
Background
Before joining the European Patent Office, Anna Cortona worked as a C1 Assistant at the University of Bayreuth for 11 months from 2002 to 2003. This experience contributed to her professional development and prepared her for her current role at the EPO, where she has built a career focused on patent examination and related processes.
Professional Experience
With nearly two decades of experience at the European Patent Office, Anna Cortona has developed a deep understanding of patent law and examination procedures. Her role involves assessing the novelty and inventive step of patent applications, particularly in her areas of specialization. She has participated in numerous oral proceedings, showcasing her ability to engage in complex discussions regarding patentability.