Cyril Joder

Patent Examiner @ European Patent Office

About Cyril Joder

Cyril Joder is a patent examiner at the European Patent Office in Munich, Germany, where he has worked since 2013. He holds a Ph.D. in Signal Processing and Pattern Recognition from Telecom ParisTech and has a background in applied mathematics and acoustics.

Work at European Patent Office

Cyril Joder has been employed as a Patent Examiner at the European Patent Office since 2013. He has accumulated over 11 years of experience in this role, working in the Munich Area, Germany. His responsibilities include evaluating patent applications and ensuring compliance with relevant regulations and standards. His role requires a strong understanding of technical subjects and the ability to assess the novelty and inventive step of various inventions.

Education and Expertise

Cyril Joder holds a Doctor of Philosophy (Ph.D.) in Signal Processing and Pattern Recognition from Telecom ParisTech, where he studied from 2008 to 2011. Prior to this, he earned an Engineer degree in Applied Mathematics from Télécom Paris in 2007-2008. He also completed a Master's degree in Acoustics, Signal Processing, and Computer Science Applied to Music at Pierre and Marie Curie University from 2007 to 2008. His educational background provides a solid foundation for his work in patent examination.

Background

Cyril Joder's professional journey includes various roles in academia and industry. Before joining the European Patent Office, he worked as a Post-doctoral researcher at Technische Universität München from 2011 to 2012. He also gained practical experience through internships at Parrot in 2006 and ENST in 2007, where he worked as an intern and later as a PhD candidate from 2007 to 2011. His diverse background contributes to his analytical skills in evaluating patents.

Previous Research Experience

Before his current position, Cyril Joder was involved in research as a Post-doctoral researcher at Technische Universität München for one year. He also served as a PhD candidate at ENST from 2007 to 2011, focusing on advanced topics in signal processing. His research experience has equipped him with in-depth knowledge and skills relevant to his role in patent examination.

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