Simon Kheifets
About Simon Kheifets
Simon Kheifets is a Senior Metrology Scientist at Metalenz, where he has worked since 2020. He has a strong academic background in physics, holding a PhD from The University of Texas at Austin and experience as a postdoctoral fellow at Harvard University.
Work at Metalenz
Simon Kheifets serves as a Senior Metrology Scientist at Metalenz, a position he has held since 2020. In this role, he focuses on advancing metrology techniques and technologies. His work contributes to the development of innovative optical solutions, leveraging his extensive background in physics and metrology.
Current Position at Harvard University
Simon Kheifets has been a Postdoctoral Fellow at Harvard University since 2016. His research involves advanced studies in metrology and optics, building on his previous experiences in academia. His ongoing work at Harvard enhances the understanding of measurement science and its applications.
Previous Research Experience
Before joining Metalenz, Simon Kheifets worked at the Harvard John A. Paulson School of Engineering and Applied Sciences as a Postdoctoral Researcher from 2018 to 2020. He also served as a Postdoctoral Fellow at the same institution from 2015 to 2016. His earlier experience includes a role as a Graduate Research Assistant at the University of Texas at Austin from 2010 to 2014.
Educational Background
Simon Kheifets earned his PhD in Physics from The University of Texas at Austin, where he studied from 2009 to 2014. Prior to that, he completed his undergraduate studies at Princeton University, obtaining an AB in Physics from 2005 to 2009. His educational background provides a strong foundation for his research and professional endeavors.
Teaching Experience
In addition to his research roles, Simon Kheifets has teaching experience as a Graduate Teaching Assistant at the University of Texas at Austin. He held this position for three months in 2009, where he contributed to the educational development of undergraduate students in physics.