Erik Larmore
About Erik Larmore
Erik Larmore is a Technical Product Manager specializing in Particle System Characterization at Mettler-Toledo International, Inc. He has a background in Chemical Engineering from the University of Maryland College Park and has experience collaborating with partners to develop image analysis algorithms.
Work at Mettler-Toledo International
Erik Larmore currently serves as a Technical Product Manager for Particle System Characterization at Mettler-Toledo International, Inc. since 2021. His role involves collaborating with academic and industrial partners to design new image analysis algorithms. Previously, he worked as a Product Specialist in the same field from 2017 to 2020, where he focused on particle systems characterization. Erik also gained experience as a Software Test Intern at Mettler-Toledo from 2016 to 2017, contributing to software testing and development.
Education and Expertise
Erik Larmore studied Chemical Engineering at the University of Maryland College Park, where he completed his undergraduate degree from 2013 to 2017. His educational background provides a strong foundation for his work in particle system characterization and image analysis. His expertise includes building requirements and use cases that guide new software technology development projects.
Background
Erik Larmore has a background in chemical engineering, which supports his technical roles in product management and specialization in particle systems. He began his career at Mettler-Toledo International, Inc. as a Software Test Intern, where he developed skills in software testing and project requirements. His progression to Product Specialist and then Technical Product Manager reflects his growth in the field.
Achievements
During his tenure at Mettler-Toledo International, Erik Larmore has contributed to the development of image analysis algorithms in collaboration with both academic and industrial partners. His work in building requirements and use cases for software technology development projects has been integral to advancing the capabilities of particle system characterization.