Minghan Xian, Ph.D.
R&D Yield Enhancement Nand Physical Failure Analysis Engineer @ Micron Technology
About Minghan Xian, Ph.D.
Minghan Xian, Ph.D., serves as an R&D Yield Enhancement NAND Physical Failure Analysis Engineer at Micron Technology, where he identifies failure mechanisms and develops tools for NAND products. He holds a Ph.D. in Chemical Engineering from the University of Florida and has authored over 40 publications in semiconductor and biomaterials research.