Ahmad Dzariff Mohd Rosman
About Ahmad Dzariff Mohd Rosman
Ahmad Dzariff Mohd Rosman is a Product Test Engineer with expertise in analog wafer probe testing. He has worked at ON Semiconductor since 2017 and previously held positions at NXP Semiconductors and Inari Amertron Berhad.
Work at ON Semiconductor
Ahmad Dzariff Mohd Rosman has been employed at ON Semiconductor since 2017, serving as a Product Test Engineer. His role involves conducting analog wafer probe testing for Wafer-Level Chip Scale Packages (WLCSP). Ahmad utilizes advanced Teradyne testers, specifically the ETS364 and ETS800, to ensure product quality and performance. His expertise in this area contributes to the development and testing of semiconductor products at the company's facility in Senawang, Negeri Sembilan.
Education and Expertise
Ahmad Dzariff Mohd Rosman earned a Bachelor’s Degree in Electrical and Electronics Engineering from Universiti Teknologi MARA, completing his studies from 2011 to 2015. His educational background provides a strong foundation for his technical skills in the semiconductor industry. He specializes in analog wafer probe testing and is proficient in operating various probers, including UF2000, EG-4090, and TEL Precio XL.
Background in Semiconductor Industry
Prior to his tenure at ON Semiconductor, Ahmad worked at NXP Semiconductors from 2015 to 2017 as a Product Test Engineer in Kuala Lumpur, Malaysia. His experience in this role contributed to his understanding of product testing processes and methodologies. Additionally, he briefly worked at Inari Amertron Berhad in 2017 as a Product Engineer and Process Engineer for four months in Bayan Lepas, Penang, Malaysia, further enhancing his industry knowledge.
Technical Skills and Specializations
Ahmad Dzariff Mohd Rosman specializes in analog wafer probe testing, focusing on WLCSP. His technical skills include operating advanced testing equipment such as Teradyne testers and probers. His proficiency with tools like the UF2000, EG-4090, and TEL Precio XL enables him to perform critical testing procedures that ensure the reliability and functionality of semiconductor products.