Changil Yoo
About Changil Yoo
Changil Yoo is a Test Engineer at ON Semiconductor, specializing in production yield analysis and failure analysis for LV/MV/HV discrete device wafers. He holds a bachelor's degree in Electronic Communication Engineering from 숭실대학교 and has been in his current role since 2018.
Work at Onsemi
Changil Yoo has been employed at ON Semiconductor since 2018, serving as a Test Engineer. His role involves responsibilities related to new product introduction (NPI) test set-up and conducting qualifications for new tester set-ups. This position allows him to apply his expertise in testing and analysis within the semiconductor industry.
Education and Expertise
Changil Yoo studied at 숭실대학교, where he pursued a degree in 전자통신공학, achieving his 학사 from 2010 to 2018. His educational background provides a strong foundation in electronic communications, which complements his professional skills in production yield analysis and failure analysis.
Background
Changil Yoo specializes in testing low voltage (LV), medium voltage (MV), and high voltage (HV) discrete device wafers. His experience includes developing and debugging tester functions, particularly using the Teradyne ETS200T system. This technical proficiency supports his work in ensuring the reliability and performance of semiconductor products.
Achievements
In his role as a Test Engineer, Changil Yoo has contributed to the qualification of new tester set-ups, which is critical for maintaining high standards in product testing. His work in production yield analysis and failure analysis plays a significant role in enhancing the efficiency and effectiveness of testing processes at ON Semiconductor.