Choon Bae Park
About Choon Bae Park
Choon Bae Park is a Senior Principal Reliability Engineer at ON Semiconductor, specializing in reliability standards and methods for the automotive industry. He has over 15 years of experience in module products and has developed a proprietary Power Cycling test system.
Work at Onsemi
Choon Bae Park has been employed at ON Semiconductor since 2016, holding the position of Sr. Principal Reliability Engineer. In this role, he focuses on reliability standards and methods, particularly within the automotive sector. His responsibilities include ensuring that products meet stringent reliability requirements and developing testing protocols to assess product durability. Park's expertise in quality systems contributes to the company's commitment to delivering high-quality semiconductor solutions.
Education and Expertise
Choon Bae Park earned a Bachelor's degree in Control Measurement Engineering from 광운대학교, where he studied from 1992 to 1997. His educational background laid the foundation for his extensive knowledge in quality systems, including DFMEA, FMDRC, APQP, and PPAP. This expertise is critical in his current role, where he applies these principles to enhance product reliability and performance.
Background
Before joining ON Semiconductor, Choon Bae Park worked at Fairchild Semiconductor for 17 years, from 1999 to 2016, where he held the position of 부장. His career began at Samsung, where he worked as 주임 from 1997 to 1999. Throughout his career, Park has developed significant experience in handling Electrical Over Stress (EOS) projects and creating test methods for EOS endurance, which has informed his approach to reliability engineering.
Achievements in Reliability Engineering
Choon Bae Park has made notable contributions to reliability engineering, including the development of a proprietary Power Cycling (PRCL) test system. This innovation enhances the testing capabilities for semiconductor products, particularly in assessing their performance under various stress conditions. With over 15 years of experience in module products such as IPM, PIM(HIM), and FPM, Park's work has been instrumental in advancing reliability standards in the semiconductor industry.