Eugene Beboso
About Eugene Beboso
Eugene Beboso is a Senior Failure Analysis Engineer at ON Semiconductor Philippines Inc, specializing in integrated circuit failure analysis using advanced techniques. He has over 18 years of experience in the field and holds a Bachelor of Science in Electronics and Communication Engineering from Don Bosco Technical College.
Work at Onsemi
Eugene Beboso has been employed at ON Semiconductor Philippines Inc since 2006, serving as a Senior Failure Analysis Engineer. In this role, he conducts in-depth integrated circuit failure analysis utilizing advanced techniques such as Photo Emission Microscope (PEM) and Optical Beam Induced Resistance Change (OBIRCH). He collaborates with various teams, including Application, Design, Product, Test, and Assembly Engineering, to address product failure analysis-related issues.
Education and Expertise
Eugene Beboso studied at Don Bosco Technical College in Mandaluyong, where he earned a Bachelor of Science in Electronics and Communication Engineering. His academic journey spanned from 1991 to 1997, culminating in a six-year program. His educational background provides a strong foundation for his expertise in failure analysis and integrated circuit testing.
Background
Eugene Beboso has a significant tenure in the field of failure analysis, with over 18 years of experience at ON Semiconductor. His responsibilities include documenting and publishing detailed analysis reports for both internal and external customers. Additionally, he trains other failure analysis engineers and technicians in electrical test bench and die level circuit analysis, contributing to the development of skills within his team.
Technical Skills
Eugene Beboso specializes in advanced failure analysis techniques, particularly Photo Emission Microscope (PEM) and Optical Beam Induced Resistance Change (OBIRCH). His technical skills enable him to perform comprehensive analyses of integrated circuits, ensuring accurate identification and resolution of failure issues. His proficiency in these areas supports the overall quality and reliability of semiconductor products.