James Mohr
About James Mohr
James Mohr is a Senior Member of Technical Staff in the Failure Analysis Lab at ON Semiconductor, where he has worked since 2006. He holds a Master's Degree in Materials Science from Arizona State University and has extensive experience in failure analysis and engineering, having previously worked at Intel Corporation and ON Semiconductor in various roles.
Current Role at ON Semiconductor
James Mohr serves as the F/A Lab Senior Member of Technical Staff at ON Semiconductor, a position he has held since 2006. In this role, he focuses on developing global failure analysis methods and tools. His responsibilities include mentoring analysts in failure analysis labs around the world, contributing to the enhancement of technical capabilities within the organization.
Previous Experience at Intel Corporation
Before joining ON Semiconductor, James Mohr worked at Intel Corporation for a total of four years. He held positions as a Failure Analysis Engineer in the uController and Automotive Failure Analysis Lab from 1986 to 1990. Additionally, he served as a Process Engineer at FAB 6 from 1982 to 1986, gaining valuable experience in semiconductor manufacturing and engineering processes.
Career at ON Semiconductor
James Mohr's career at ON Semiconductor spans multiple roles and years. He began as a Failure Analysis Engineer from 1996 to 1999 and later advanced to the position of Failure Analysis Lab Physical Analysis Group Leader, serving from 1999 to 2006. His extensive experience within the company has allowed him to develop expertise in failure analysis and contribute to the company's technical advancements.
Educational Background
James Mohr holds a Master’s Degree in Materials Science from Arizona State University, where he studied from 1988 to 1990. He also earned a Bachelor of Science in Electrical and Electronics Engineering from Penn State University, completing his studies from 1979 to 1982. His educational background provides a strong foundation for his work in semiconductor technology and failure analysis.