Jeffrey Ramos
About Jeffrey Ramos
Jeffrey Ramos serves as the Principal Failure Analysis Engineer at ON Semiconductor, where he has worked since 2010. He possesses extensive experience in die-level failure analysis of semiconductor devices, particularly in image sensors and ASICs for automotive applications.
Work at ON Semiconductor
Jeffrey Ramos has been employed at ON Semiconductor since 2010, serving as a Principal Failure Analysis Engineer in Carmona, Cavite, Philippines. In this role, he has focused on die-level failure analysis of semiconductor devices, with a particular emphasis on image sensors and ASICs for automotive applications. He also provides failure analysis support to ON Semiconductor facilities located in the USA, Malaysia, China, and Japan. Prior to his current position, he worked as a Senior Section Head at ON Semiconductor from 2008 to 2010 in Seremban, Negeri Sembilan, Malaysia.
Education and Expertise
Jeffrey Ramos earned a Bachelor of Science degree in Electronics Engineering from Don Bosco Technical College in Mandaluyong, where he studied from 1992 to 1997. His educational background laid the foundation for his extensive career in the semiconductor industry. He possesses significant expertise in various failure analysis techniques, including Laser Signal Injection Microscopy, Soft Defect Localization, and Photon Emission Microscopy, which are critical for diagnosing issues in semiconductor devices.
Background in Semiconductor Industry
Before joining ON Semiconductor, Jeffrey Ramos worked at Analog Devices as a Senior Failure Analysis Engineer from 2003 to 2008 in General Trias, Cavite, Philippines. His experience in the semiconductor industry spans over two decades, during which he has developed a strong skill set in failure analysis. Additionally, he has a background as an analog IC design engineer, specializing in Power Management ICs, before transitioning to failure analysis roles.
Achievements in Failure Analysis
Throughout his career, Jeffrey Ramos has facilitated significant projects, including the transfer of failure analysis support for the Sanyo Semiconductor Standard/Analog IC group from the Gunma, Japan facility to Carmona. His contributions have enhanced the operational capabilities of the failure analysis teams at ON Semiconductor, demonstrating his commitment to improving processes and support within the organization.