Joanna Abigael Daseco
About Joanna Abigael Daseco
Joanna Abigael Daseco is a Test Development Engineer at ON Semiconductor, specializing in correlation studies and gauge repeatability and reproducibility in test development engineering. She holds a Master's degree in Materials Science and Engineering and a Bachelor's degree in Physics from the University of the Philippines.
Work at ON Semiconductor
Joanna Abigael Daseco has been employed at ON Semiconductor as a Test Development Engineer since 2016. In this role, she specializes in performing correlation studies and gauge repeatability and reproducibility (GRR) in test development engineering. Her responsibilities include conducting spike checks and hardware and software debugging. She also supports test manufacturing by addressing issues related to low yield and over-rejection, ensuring that product quality is maintained.
Education and Expertise
Joanna Daseco holds a Master of Science in Materials Science and Engineering, which she obtained from the University of the Philippines from 2012 to 2015. Her studies focused on Plasma Surface Modification. Prior to this, she earned a Bachelor of Science in Physics from the same university, studying from 2006 to 2012 with a concentration in Plasma Physics. This educational background provides her with a solid foundation in materials science and engineering principles.
Background
Before joining ON Semiconductor, Joanna Daseco worked as a New Product Introduction Engineer at SunPower Philippines Manufacturing Limited from 2015 to 2016. In this position, she was involved in various engineering activities, including yield validation and capability (cpk) analysis to ensure product quality. Her experience in both roles has equipped her with a comprehensive understanding of test development and manufacturing processes.
Achievements in Engineering
Throughout her career, Joanna Daseco has been involved in critical engineering activities such as performing correlation studies and gauge repeatability and reproducibility (GRR) assessments. She has also conducted yield validation and capability (cpk) analysis, which are essential for maintaining product quality. Her work in addressing low yield and over-rejection issues has contributed to the efficiency of test manufacturing processes.