Joey Byeong Yeop Lee
About Joey Byeong Yeop Lee
Joey Byeong Yeop Lee is a Staff Engineer at ON Semiconductor, where he has worked since 2016, and has over 18 years of experience in the semiconductor industry. He specializes in reliability engineering, having developed monitoring systems and conducted various reliability tests to ensure compliance with industry standards.
Work at ON Semiconductor
Joey Byeong Yeop Lee has been employed at ON Semiconductor since 2006, initially as a Principal Engineer. In 2016, he transitioned to the role of Staff Engineer, where he has worked for 8 years. His responsibilities include planning the Reliability Monitor Program (RMP) to evaluate device reliability performance. He has also introduced new reliability equipment and managed its engineering processes. Lee has played a significant role in conducting various reliability tests, including life tests and environmental tests, to ensure the performance and durability of semiconductor devices.
Education and Expertise
Lee earned his Bachelor's degree in Electronics Engineering from Inha University, where he studied from 2000 to 2006. He later pursued a Master's degree in Management of Technology (MOT) at Hanyang University, completing his studies from 2013 to 2015. His educational background provides a solid foundation for his expertise in reliability engineering and technology management, which he applies in his current role at ON Semiconductor.
Background
Before joining ON Semiconductor, Joey Byeong Yeop Lee worked at Fairchild Semiconductor as a Senior Engineer for 18 years. His extensive experience in the semiconductor industry includes qualifying reliability test processes to meet JEDEC specifications. He has developed a real-time monitoring system using LabVIEW to track leakage levels of MOSFETs, demonstrating his technical skills and commitment to improving device reliability.
Achievements in Reliability Engineering
Lee has generated 4D and 8D corrective action reports to address reliability issues promptly. He has conducted initial verification and failure analysis for RMP devices, focusing on L-IC and discrete components. Additionally, he has established a reliability process map to streamline engineering procedures, enhancing the efficiency of reliability assessments and tests.
Compliance and Certification
Joey Byeong Yeop Lee has processed ISO17025 certification procedures to ensure compliance with international standards. His work in this area reflects his commitment to maintaining high-quality standards in reliability testing and engineering practices within the semiconductor industry.