Joseph Rhayem
About Joseph Rhayem
Joseph Rhayem is a Customer Quality Manager at ON Semiconductor, specializing in the characterization and simulation of high voltage, high power devices. He holds a Ph.D. from the University of Montpellier and has authored several publications in the field of electrical noise characterization and electro-thermal modeling.
Work at Onsemi
Joseph Rhayem has been employed at ON Semiconductor since 2004. He initially served as a Modeling Manager Engineer until 2009. Following that role, he transitioned to the position of Customer Quality Manager in 2012, where he has worked for over a decade in Oudenaarde, Belgium. Additionally, he has held the role of Project Manager since 2009, contributing to various projects within the company. His responsibilities include developing optimized power kits cells and simulation tools for electro-thermal reliability assessment.
Education and Expertise
Joseph Rhayem completed his Ph.D. at the University of Montpellier from 1996 to 2000, focusing on the modeling and characterization of 1/f noise in thin-film transistors (TFT) and advanced CMOS technologies. His academic background has equipped him with expertise in electrical noise characterization in advanced CMOS technologies. This foundation supports his current work in the characterization and simulation of high voltage, high power devices, particularly DMOS and power FET devices.
Publications and Contributions
Joseph Rhayem has authored and contributed to several publications in the field of semiconductor technology. Notably, he presented a paper titled 'Electro-Thermal Characterization and Simulation of Integrated Multi Trenched XtreMOS Power Devices' at Therminic 2010 in Barcelona, Spain. He also contributed to the publication 'Impact of Scaling Down from 0,25um to 0,18um CMOS technology on 1/f noise: Characterisation and Modeling' at ESSDERC 2002 in Firenze, Italy. Additionally, he presented a paper on 'New Methodology on Electro-Thermal Characterization and Modeling of Large Power Drivers Using Lateral PNP BJTs' at EUROSIME 2010 in Bordeaux, France.
Background
Joseph Rhayem has a strong background in semiconductor technology, with a focus on high voltage and high power devices. His career at ON Semiconductor spans multiple roles, allowing him to develop a comprehensive understanding of modeling and characterization in this field. His educational journey at the University of Montpellier laid the groundwork for his expertise in electrical noise characterization and simulation methodologies.