Kevin Cantos
About Kevin Cantos
Kevin Cantos is an Engineer II specializing in Failure Analysis at ON Semiconductor since 2019. He has extensive experience in advanced fault isolation techniques and holds a Bachelor of Engineering in Electrical, Electronics, and Communications Engineering from Adamson University.
Work at ON Semiconductor
Kevin Cantos has been employed at ON Semiconductor as an Engineer II in Failure Analysis since 2019. In this role, he utilizes advanced fault isolation techniques to identify and resolve issues within semiconductor devices. His expertise includes the application of Emission Microscopy and Liquid Crystal Analysis, which are critical in the failure analysis process. Kevin's work contributes to the reliability and performance of semiconductor products, ensuring they meet industry standards.
Previous Experience in Failure Analysis
Before joining ON Semiconductor, Kevin worked at Maxim Integrated as an Engineer II in Failure Analysis from 2015 to 2019. During this four-year tenure, he honed his skills in both passive and active micro probing techniques at the die level. His experience in this role provided him with a solid foundation in advanced fault detection methods, which he continues to apply in his current position.
Biomedical Technician Role
Kevin's career began at Makati Medical Center, where he served as a Biomedical Technician for six months in 2014. This role allowed him to gain experience in the medical technology field, providing him with a diverse background that complements his engineering expertise. His early work in biomedical technology has contributed to his analytical skills in failure analysis.
Education and Expertise
Kevin Cantos earned a Bachelor of Engineering (B.E.) in Electrical, Electronics and Communications Engineering from Adamson University, completing his studies from 2009 to 2014. This educational background laid the groundwork for his technical skills and knowledge in engineering principles. His academic training supports his current work in failure analysis, where he employs various sophisticated techniques.
Technical Skills in Failure Analysis
Kevin specializes in advanced techniques for failure analysis, including Optical Beam Reduced Resistance Change (OBIRCH) and Enhanced Lock-in Thermal Emission (ELITE). He conducts thorough root cause investigations through circuit schematic and layout analysis. Additionally, he is skilled in using X-prep for precise mechanical milling during die level analysis. Kevin produces detailed reports based on his findings, ensuring that the data is communicated effectively to stakeholders.