Mathigaran Subramaniam

Mathigaran Subramaniam

Defectivity Process Engineer @ Onsemi

About Mathigaran Subramaniam

Mathigaran Subramaniam is a Defectivity Process Engineer at ON Semiconductor, specializing in data analysis to identify root causes and develop solutions. He has implemented several automated inspection processes and has worked in the semiconductor industry for over a decade.

Work at Onsemi

Mathigaran Subramaniam currently serves as a Defectivity Process Engineer at ON Semiconductor, a position he has held since 2018. In this role, he focuses on enhancing defectivity processes within the organization. Prior to this, he worked as a Defectivity Process Technician at ON Semiconductor from 2014 to 2018, where he contributed to various projects in Malaysia. His experience in both roles has allowed him to develop expertise in process improvement and automation.

Education and Expertise

Mathigaran Subramaniam studied Electrical and Electronics Engineering at Kolej PTPL, where he earned a High School Diploma. His educational background provides a solid foundation for his work in semiconductor manufacturing, particularly in defectivity analysis. He specializes in analyzing data to identify root causes of defects and developing permanent solutions, which is essential in his current engineering role.

Background

Mathigaran Subramaniam has a background in semiconductor manufacturing, specifically in defectivity processes. He began his career at ON Semiconductor in Malaysia, where he gained valuable experience over four years as a Defectivity Process Technician. His transition to a Defectivity Process Engineer role reflects his growth and increasing responsibilities within the company.

Achievements

During his tenure at ON Semiconductor, Mathigaran Subramaniam implemented significant process improvements. He pioneered the introduction of the first automated Mask plate inspection process and upgraded the manual sampling inspection process to a 100% Automatic Optical Inspection process. Additionally, he implemented the first automated wafer back inspection process at ON ISMF, showcasing his commitment to enhancing operational efficiency.

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