Nick Miller
About Nick Miller
Nick Miller is a Material Science Engineer with extensive experience in process characterization and failure analysis. He has worked at ON Semiconductor since 2015 and holds a BSE in Chemical Engineering from Arizona State University.
Work at ON Semiconductor
Nick Miller has been employed at ON Semiconductor since 2015, currently holding the position of Material Science Engineer. His role involves working in the Technology Assessment and Characterization Laboratory (TACL), where he applies his expertise in material science to various projects. Prior to his current role, he served as a Product Analysis Intern at ON Semiconductor for a total of 2 years, from 2013 to 2015, and briefly in 2012 for 3 months. His experience at ON Semiconductor has equipped him with a strong foundation in semiconductor processes and material characterization.
Education and Expertise
Nick Miller earned a Bachelor of Science in Engineering (BSE) in Chemical Engineering from Arizona State University, completing his studies from 2011 to 2015. His academic background provides a solid foundation for his work in material science. He specializes in process characterization and failure analysis, utilizing advanced techniques such as Scanning Electron Microscopy (SEM), Energy Dispersive X-ray Spectroscopy (EDS), and optical profilometry for precise surface measurements. His technical skills also include the use of Focused Ion Beam (FIB) and Atomic Force Microscopy (AFM) for detailed material analysis.
Background
Before pursuing a career in material science, Nick Miller worked as a lifeguard at Lifetime Fitness in Gilbert, Arizona, from 2009 to 2012. This role lasted for 3 years and provided him with early work experience. His transition from a lifeguard to a material science engineer reflects a significant shift in career focus, driven by his educational pursuits in chemical engineering and his subsequent roles in the semiconductor industry.
Technical Skills and Techniques
Nick Miller employs a variety of advanced techniques in his work as a Material Science Engineer. He specializes in process characterization and failure analysis, utilizing Scanning Electron Microscopy (SEM) and Energy Dispersive X-ray Spectroscopy (EDS) for material evaluation. Additionally, he uses optical profilometry to obtain precise surface measurements, which are critical in semiconductor processes. His expertise also includes the use of Focused Ion Beam (FIB) and Atomic Force Microscopy (AFM) to conduct detailed material analysis, enhancing the understanding of material properties and behaviors.