Pascal Sevetian
About Pascal Sevetian
Pascal Sevetian is a Senior Test Engineer at ON Semiconductor in France, with over 14 years of experience in the field. He has a strong background in test engineering, having previously worked at LTX Corporation, Motorola, and Freescale, and has contributed to significant cost savings through innovative testing solutions.
Work at ON Semiconductor
Pascal Sevetian has been employed at ON Semiconductor since 2010, where he serves as a Senior Test Engineer. His role involves overseeing the testing processes for various semiconductor products. He previously held a position as a Test Engineer at ON Semiconductor from 2000 to 2005, accumulating five years of experience before returning to the company. His contributions include the development of an innovative tool for managing analog and digital setups, which has significantly improved efficiency in testing.
Previous Experience in Semiconductor Industry
Prior to his current role, Pascal Sevetian worked at LTX Corporation as an Application Engineer from 2005 to 2009 for four years. He also gained experience at Motorola as a Test Engineer Trainee from 1997 to 1999 for two years and at Freescale as LTX On-Site Support from 2005 to 2006 for one year. This extensive background in the semiconductor industry has equipped him with a diverse skill set applicable to his current position.
Education and Expertise
Pascal Sevetian studied at the University of Lille 1 Sciences and Technology, where he completed his education from 1991 to 1997. His academic background has provided him with a strong foundation in engineering principles, which he has applied throughout his career in the semiconductor field. His expertise includes designing and calibrating testing modules and leading the development of test processes for various applications.
Achievements in Test Engineering
In his role as a Senior Test Engineer, Pascal Sevetian achieved an 80% reduction in test time on two Power Management IC projects. This accomplishment resulted in over $4 million in production cost savings. He has also designed and calibrated a module for accurate peak measurement of high-frequency signals, specifically for testing a Wireless Charger IC in a production environment. Additionally, he led the development and qualification of test processes for automotive LED drivers using the T2K tester.