Ryan Fredrickson
About Ryan Fredrickson
Ryan Fredrickson serves as the Failure Analysis Lab Manager at ON Semiconductor, a position he has held since 2008. He holds a Bachelor's degree in Mathematics and Physics and a Master's degree in Physics, both from the University of Oregon.
Work at ON Semiconductor
Ryan Fredrickson has been employed at ON Semiconductor since 2008, where he currently holds the position of Failure Analysis Lab Manager. In this role, he oversees the operations of the failure analysis lab, ensuring that processes are efficient and effective in identifying and resolving product failures. His extensive experience at ON Semiconductor includes a previous role as a Failure Analysis Engineer from 2005 to 2008, where he developed foundational skills in failure analysis techniques.
Education and Expertise
Ryan Fredrickson earned a Bachelor of Science degree in Mathematics and Physics from the University of Oregon, completing his studies from 1995 to 1999. He furthered his education by obtaining a Master of Science degree in Physics from the same institution, which he completed in 2000. This educational background provides him with a strong foundation in analytical and problem-solving skills relevant to his work in failure analysis.
Background
Ryan Fredrickson's professional journey in the semiconductor industry began in 2005 when he joined ON Semiconductor as a Failure Analysis Engineer. His career has been marked by a focus on failure analysis, culminating in his current role as Lab Manager. His academic training in mathematics and physics has equipped him with the necessary skills to address complex technical challenges in his field.
Professional Experience
With over 16 years of experience at ON Semiconductor, Ryan Fredrickson has developed a deep understanding of failure analysis processes and methodologies. His transition from a Failure Analysis Engineer to Lab Manager reflects his growth and expertise in the field. His role involves managing lab operations and leading a team to investigate product failures, contributing to the overall quality and reliability of semiconductor products.