Shelly Arico
About Shelly Arico
Shelly Arico is a Failure Analysis Technician with over 30 years of experience in Semiconductor Failure Analysis and Metrology Evaluation. Currently employed at onsemi, she has previously held positions at NXP, IBM, and GLOBALFOUNDRIES, specializing in root cause analysis and process characterization.
Work at Onsemi
Shelly Arico currently serves as a Failure Analysis Technician at onsemi, a position she has held since 2023. Her role involves conducting detailed analyses to identify the root causes of failures in semiconductor devices. This position is based in East Fishkill, NY, where she applies her extensive experience in failure analysis to enhance product reliability and performance.
Previous Experience at NXP
Before joining onsemi, Shelly Arico worked at NXP as a Senior Failure Analysis Technician from 1997 to 2009. During her 12 years at NXP, she developed expertise in semiconductor failure analysis, contributing to various projects aimed at improving product quality and reliability.
Career at GLOBALFOUNDRIES
Shelly Arico has a significant tenure at GLOBALFOUNDRIES, where she has worked in various capacities since 2011. She served as a Failure Analysis Technician from 2011 to 2013 and later transitioned to a TEM Failure Analysis Tech role in 2015, where she continues to work. Her experience at GLOBALFOUNDRIES has further solidified her skills in failure analysis and metrology evaluation.
Education and Expertise
Shelly Arico studied at Rockland Community College from 1996 to 1999 and at Arapahoe Community College from 1986 to 1988. Her educational background complements her 30 years of combined experience in semiconductor failure analysis and metrology evaluation. She specializes in root cause analysis, yield enhancement, and process characterization.
Mentorship and Knowledge Sharing
Shelly Arico actively seeks opportunities to mentor and share her knowledge with the next generation of Failure Analysis teams. Her commitment to mentoring reflects her dedication to the field and her desire to contribute to the professional development of others in semiconductor failure analysis.