Todd Neumann
About Todd Neumann
Todd Neumann is a Staff Mixed Signal Test Engineer with extensive experience in testing semiconductor devices. He has worked at ON Semiconductor since 2008 and previously held the same position at IBM from 1995 to 2001.
Work at Onsemi
Todd Neumann has been employed at ON Semiconductor since 2008, serving as a Staff Mixed Signal Test Engineer for 16 years in Pocatello, Idaho. In this role, he specializes in testing and debugging a variety of semiconductor devices, including PRMLs, gyroscopes, and circuit breakers. His responsibilities encompass the design, development, qualification, and production phases of semiconductor devices, ensuring that they meet industry standards and performance requirements.
Previous Experience at IBM
Before joining ON Semiconductor, Todd Neumann worked at IBM as a Staff Mixed Signal Test Engineer from 1995 to 2001 for six years in Essex Junction, Vermont. During his tenure at IBM, he gained valuable experience in the field of mixed signal testing, which laid the foundation for his future work in semiconductor testing and development.
Education and Expertise
Todd Neumann earned a Bachelor of Science (BS) degree in Electrical and Electronics Engineering from the University of Massachusetts at Lowell, where he studied from 1986 to 1991. His educational background provides a strong foundation for his expertise in testing die/package level designs using prober and autohandlers. He has extensive experience in writing ATE code for both wafer and package testing of mixed signal electrical devices.
Technical Skills and Specializations
Todd Neumann possesses specialized skills in testing and debugging semiconductor devices, with a focus on embedded circuitry components such as ADCs, DACs, filters, and current mirrors. His technical expertise includes extensive knowledge of die/package level testing and the use of automated test equipment (ATE) for mixed signal electrical devices, contributing to the efficiency and accuracy of semiconductor testing processes.