Tomáš Kozub
About Tomáš Kozub
Tomáš Kozub is a TCAD Engineer at ON Semiconductor in the Slovak Republic, specializing in the characterization of ESD devices. He holds a Master's Degree in Electronics and Photonics and a Bachelor's Degree in Electrical and Electronics Engineering from Slovenská technická univerzita v Bratislave.
Work at ON Semiconductor
Tomáš Kozub has been employed at ON Semiconductor since 2016, where he holds the position of TCAD Engineer. His role involves utilizing advanced simulation tools to support the design and characterization of semiconductor devices. He has contributed to various projects within the company, focusing on enhancing device performance and reliability. His experience spans over eight years in this role, during which he has developed a strong understanding of the semiconductor industry.
Education and Expertise
Tomáš Kozub earned his Master’s Degree in Electronics and Photonics from Slovenská technická univerzita v Bratislave, where he studied from 2015 to 2018. Prior to this, he completed his Bachelor’s Degree in Electrical and Electronics Engineering at the same university from 2012 to 2015. Additionally, he studied Elektrotechnika at Stredná priemyselná škola technická Martin from 2008 to 2012. His academic background provides a solid foundation for his specialization in the characterization of ESD devices, including TLP and HBM measurement techniques.
Background
Tomáš Kozub has a comprehensive educational background in electronics and electrical engineering. He began his studies in Elektrotechnika at Stredná priemyselná škola technická Martin, which laid the groundwork for his further education. He then pursued higher education at Slovenská technická univerzita v Bratislave, where he completed both his Bachelor’s and Master’s degrees. This progression reflects his commitment to advancing his knowledge and skills in the field of electronics.
Achievements in Semiconductor Measurement Automation
In his professional capacity, Tomáš Kozub has developed expertise in the automation of measurement processes within the semiconductor industry. This specialization allows for increased efficiency and accuracy in device characterization. His work contributes to the advancement of measurement techniques, particularly in the context of ESD device characterization, which is critical for ensuring device reliability and performance.