Warren Latter
About Warren Latter
Warren Latter is a Test Engineering Principal at ON Semiconductor, where he has worked since 2020 in Burlington, Ontario. He has extensive experience in test engineering, having previously held positions at Nortel and Gennum Corporation, and specializes in high-speed mixed signal testing and automated test development.
Work at ON Semiconductor
Warren Latter has been serving as Test Engineering Principal at ON Semiconductor since 2020. His role is based in Burlington, Ontario, Canada. Prior to this position, he held multiple roles within the company, including Senior Test Engineer from 2013 to 2015 and Staff Test Engineer from 2015 to 2020. In these capacities, he contributed to the development of test solutions and systems, enhancing the efficiency of testing processes.
Previous Experience at Nortel
Before joining ON Semiconductor, Warren Latter worked at Nortel from 1984 to 1995 as a Super Tech. During his 11 years at Nortel, he gained valuable experience in the telecommunications sector, which laid the foundation for his future roles in test engineering.
Expertise in Test Engineering
Warren Latter specializes in high-speed mixed signal testing and automated test development. He has led significant projects, including the development of a test data repository and a web-based data analysis system, which improved company-wide activities. His work includes developing test solutions for complex devices, such as hearing instrument SiPs with integrated RF BLE and TRFC multi-site probe.
Education and Qualifications
Warren Latter studied at Sheridan College, focusing on Electronics. He achieved an Electronics Engineering Technology (EET) qualification in 1984. His educational background has equipped him with the technical skills necessary for his roles in test engineering.
Achievements in Test Development
Throughout his career, Warren Latter has championed the use of test data for characterization and yield improvement. He has created business cases and selection criteria for various test systems and designed an in-house analog test system, leading acceptance testing for a new test system.