Won Geun Park
About Won Geun Park
Won Geun Park is a Test Engineer at ON Semiconductor, where he has worked since 2015, specializing in semiconductor testing and program development using C/C++. He holds a Bachelor of Engineering in Electronic Materials Engineering from 광운대학교 and previously interned at STATS ChipPAC Ltd.
Work at ON Semiconductor
Currently, Won Geun Park serves as a Test Engineer at ON Semiconductor, a position he has held since 2015. In this role, he develops test programs from scratch using C/C++ specifically for semiconductor testing. His responsibilities also include designing load boards and probe cards utilizing PADS software. Additionally, he introduces application circuits as part of the test engineering process, contributing to the efficiency and effectiveness of the testing protocols.
Education and Expertise
Won Geun Park earned a Bachelor of Engineering (B.E.) in Electronic Materials Engineering from 광운대학교, completing his studies from 2008 to 2015. His academic background provides a solid foundation for his technical skills in the semiconductor industry. He specializes in setting up wafer probe and final tests for AC-DC products, utilizing Teradyne Eagle ETS-364/300 equipment, which highlights his expertise in testing methodologies.
Background
Before joining ON Semiconductor, Won Geun Park gained practical experience as an intern at STATS ChipPAC Ltd. from 2014 to 2015. This six-month internship provided him with insights into the semiconductor testing environment and helped him develop essential skills that he applies in his current role. His background in both education and early career experiences has shaped his professional development in the field.
Technical Skills
In his role as a Test Engineer, Won Geun Park demonstrates proficiency in several technical areas. He develops test programs using C/C++, which is crucial for semiconductor testing. His ability to design load boards and probe cards with PADS software showcases his technical acumen. Furthermore, his specialization in setting up wafer probe and final tests for AC-DC products using advanced testing equipment underscores his capability in the semiconductor testing domain.