Young C. Lee
About Young C. Lee
Young C. Lee serves as the Sr Manager of Reliability Engineering at ON Semiconductor, where he has worked since 2016. With over 20 years of experience in reliability and failure analysis, he has held various engineering roles in companies such as Fairchild Semiconductor and Samsung Electronics.
Work at ON Semiconductor
Young C. Lee has been serving as the Senior Manager of Reliability Engineering at ON Semiconductor since 2016. In this role, he has accumulated eight years of experience in Mountain Top, Pennsylvania. His responsibilities include managing the reliability aspects of new products and technologies within the organization. Lee also represents ON Semiconductor as a working group member for automotive power module qualification guidelines, collaborating with the European Center for Power Electronics (ECPE). Prior to his current position, he held various roles at Fairchild Semiconductor, which is now part of ON Semiconductor.
Previous Experience in Reliability Engineering
Before joining ON Semiconductor, Young C. Lee worked at Fairchild Semiconductor from 1999 to 2012, where he held several positions including Staff Engineer and Manager of Reliability Engineering. His tenure at Fairchild involved managing reliability and failure analysis engineering, contributing to the development of automotive products. Additionally, he worked at Samsung Electronics from 1991 to 1999 as an Analyst in Failure Analysis Engineering, gaining valuable experience in the field. Lee's extensive background in reliability engineering spans over 20 years.
Education and Expertise
Young C. Lee earned a Master of Science (MS) degree in Electrical and Electronics Engineering from Yonsei University. His educational background provides a strong foundation for his expertise in reliability engineering. Lee possesses in-depth knowledge of power semiconductor technologies, wafer fabrication processes, assembly processes, and failure analysis. He is experienced in conducting reliability and acceleration stress tests for new fabrication technologies, assembly packages, and die designs.
Professional Contributions and Committees
Young C. Lee has actively contributed to the automotive electronics sector through his involvement in various technical committees. He served as a technical committee member representing Fairchild Semiconductor in the Automotive Electronics Council (AEC). His expertise in reliability engineering and failure analysis has positioned him as a key contributor to industry standards and guidelines, particularly in automotive power module qualifications.
Specialized Skills in Reliability Testing
Young C. Lee has developed specialized skills in reliability testing, including the design of reliability test circuits for Integrated Circuits, Discrete, and power module products. He is proficient in the 8D problem-solving process, addressing various failure mechanisms such as fabrication issues, assembly challenges, and electrical overstress/electrostatic discharge (EOS/ESD). His experience includes managing the qualification of new products and technologies, ensuring that automotive products meet rigorous reliability standards.