Hans Christen
About Hans Christen
Hans Christen serves as the Director of the Neutron Scattering Division at Oak Ridge National Laboratory, a position he has held since 2018. He has extensive experience in materials science, having previously directed the Center for Nanophase Materials Sciences and held various roles at Oak Ridge National Laboratory since 2000.
Current Role at Oak Ridge National Laboratory
Hans Christen serves as the Director of the Neutron Scattering Division at Oak Ridge National Laboratory (ORNL). He has held this position since 2018, overseeing research and development in neutron scattering techniques and their applications in various scientific fields. His leadership contributes to advancing the understanding of materials at the atomic level, facilitating breakthroughs in multiple disciplines.
Previous Experience at Oak Ridge National Laboratory
Prior to his current role, Hans Christen held several positions at Oak Ridge National Laboratory. He was the Director of the Center for Nanophase Materials Sciences from 2014 to 2018. Before that, he served as the Associate Division Director for Novel Materials and Mechanism within the Materials Science and Technology Division for ten months in 2013. Additionally, he was a Distinguished Research Staff Member and Group Leader from 2000 to 2013, and an ORNL manager for the BES Materials Sciences and Engineering Program from 2011 to 2013.
Educational Background
Hans Christen earned his Doctor of Philosophy (Ph.D.) in Physics from the École polytechnique fédérale de Lausanne. His academic background provides a strong foundation for his research and leadership roles in materials science and neutron scattering. He also studied at the Center for Creative Leadership, enhancing his management and leadership skills.
Early Career at Neocera
Before joining Oak Ridge National Laboratory, Hans Christen worked at Neocera as a Staff Scientist and Program Manager for Microwave Microscopy from 1997 to 2000. In this role, he contributed to the development of advanced microscopy techniques, which are essential for the characterization of materials at the nanoscale.