Juan Carlos Idrobo
About Juan Carlos Idrobo
Juan Carlos Idrobo serves as the Scanning Transmission Electron Microscopy (STEM) Group Leader at Oak Ridge National Laboratory, where he specializes in advanced electron microscopy methods to study material properties. He has developed novel STEM imaging techniques focused on electron spectroscopy at the atomic scale.
Current Role at Oak Ridge National Laboratory
Juan Carlos Idrobo currently serves as the Scanning Transmission Electron Microscopy (STEM) Group Leader at Oak Ridge National Laboratory. He has held this position since 2020, contributing to advancements in electron microscopy techniques. In addition to his leadership role, he is also recognized as a Senior Staff Scientist, a position he has maintained since 2019. His work focuses on the application of advanced electron microscopy methods to study material properties.
Education and Academic Background
Juan Carlos Idrobo has an extensive academic background in Physics. He earned his Doctor of Philosophy (PhD) from the University of California, Davis, where he studied from 2003 to 2004. Prior to that, he completed a Master's degree in Physics at the University of Illinois at Chicago from 2000 to 2003. His undergraduate studies were conducted at Escuela Politécnica Nacional, where he achieved a Bachelor's degree in Physics from 1993 to 1998. He also studied at Universidad de Los Andes for one year in 1998.
Professional Experience at Oak Ridge National Laboratory
Juan Carlos Idrobo has significant experience at Oak Ridge National Laboratory, where he has worked in various capacities. He served as a Staff Scientist from 2011 to 2019, before transitioning to Group Leader for a brief period in 2019. He returned to the role of Group Leader in 2020 and has continued to lead the STEM group. His tenure at Oak Ridge spans over a decade, highlighting his commitment to advancing research in electron microscopy.
Research Contributions and Innovations
Juan Carlos Idrobo has made notable contributions to the field of electron microscopy through the development of novel STEM imaging techniques. His research emphasizes electron spectroscopy at the atomic scale, which enhances the analysis of materials properties. He has been involved in creating nanometer-scale imaging techniques that improve material analysis, showcasing his expertise in advanced microscopy methods.