Aaron Meyrick
About Aaron Meyrick
Aaron Meyrick is a Sr. Metrologist at Sandia National Laboratories with extensive experience in metrology and electronics technology.
Current Position at Sandia National Laboratories
Aaron Meyrick currently holds the position of Sr. Metrologist at Sandia National Laboratories. He commenced this role in February 2015. Sandia National Laboratories is a key player in advancing the state of scientific knowledge and technology, and Aaron is instrumental in its operations as a Sr. Metrologist. His responsibilities likely involve ensuring the precision and accuracy of measurement instruments, contributing to the reliability and consistency of scientific data.
Previous Roles at Raytheon
Before joining Sandia National Laboratories, Aaron Meyrick worked at Raytheon. From 2013 to 2015, he served as the Metrology Operations Technical Manager, overseeing technical aspects of metrology operations. Prior to this, he held the position of Sr. Technical Support Engineer at Raytheon from 2006 to 2013. His role involved providing advanced technical support and expertise in metrology, likely contributing to Raytheon's projects and product development.
Career at Fluke Corporation
Aaron Meyrick's career includes significant tenure at Fluke Corporation. He served as the Metrology Operations Manager from 1996 to 2005, focusing on overseeing metrology operations. Before this, he was a Metrologist from 1993 to 1998 and an Associate Metrologist from 1992 to 1993. His cumulative experience at Fluke Corporation provided him with extensive knowledge in metrology and operations management, contributing to his development as a seasoned professional in the field.
Educational Background in Electronics Technology
Aaron Meyrick has a strong educational foundation in electronics technology. He earned an Associate of Arts and Sciences (AAS) degree in Electronics Technology from Edmonds Community College, where he studied from 1977 to 1979. Additionally, he attended Brigham Young University - Idaho from 1975 to 1976 and the University of New Mexico School of Engineering from 1974 to 1975. His academic background laid the groundwork for his technical expertise and career in metrology.
Expertise in ISO Standards and Process Improvement
Throughout his career, Aaron Meyrick has developed expertise in ISO 17025, Six Sigma, Lean Manufacturing, Continuous Improvement, and ISO Standards. His proficiency in these areas indicates his ability to enhance operational efficiency and ensure compliance with international standards. This expertise is vital in maintaining the high quality and reliability of measurements within any scientific or engineering environment.