Andre Luis Fernandes Cauduro
About Andre Luis Fernandes Cauduro
Andre Luis Fernandes Cauduro is a Postdoctoral Researcher at Sandia National Laboratories specializing in functional thin-films for energy device applications.
Title
Andre Luis Fernandes Cauduro holds the position of Postdoctoral Researcher.
Current Position at Sandia National Laboratories
Andre Luis Fernandes Cauduro has been working as a Postdoctoral Researcher at Sandia National Laboratories in Livermore, California, United States since 2020. His work there focuses on advancing research in the field of functional thin-films for energy device applications.
Previous Experience at Berkeley Lab
Before joining Sandia National Laboratories, Andre Luis Fernandes Cauduro was a Postdoctoral Research Fellow at Berkeley Lab in Berkeley from 2017 to 2020. During his three-year tenure, he conducted significant research into the fundamental physical-chemistry properties of surfaces and interfaces for novel electronic and optoelectronic device applications.
Education and Expertise
Andre Luis Fernandes Cauduro has an extensive academic background. He earned his Doctor of Philosophy (PhD) in Engineering Science from the University of Southern Denmark, completing his studies from 2012 to 2017. Prior to this, he obtained his Master's degree in Microelectronics from Universidade Federal do Rio Grande do Sul (UFRGS) from 2010 to 2011. He also holds a Bachelor's degree in Physics from the same institution, achieved between 2005 and 2009. His expertise lies in the study of functional thin-films for energy device applications, utilizing advanced surface techniques such as photoelectron spectroscopies (X-ray and UV) and spin-polarized low energy electron microscopy (SPLEEM).
Research Specialization
Andre Luis Fernandes Cauduro's research specializes in analyzing the physical-chemistry properties at surfaces and interfaces, pivotal for novel electronic and optoelectronic device applications. His work extensively employs advanced techniques like photoelectron spectroscopies, inclusive of X-ray and UV, as well as spin-polarized low energy electron microscopy (SPLEEM) to achieve detailed insights into material properties.