Danelle Tanner
About Danelle Tanner
Danelle Tanner is a Principal Member Technical Staff with expertise in MEMS testing standards and predictive models for MEMS accelerated aging.
Title
Danelle Tanner holds the position of Principal Member Technical Staff. Her career has been marked by significant contributions to various technological and scientific fields, particularly in the development of MEMS testing standards and predictive models for MEMS accelerated aging. She is focused on advancing new technology in MEMS reliability and packaging.
Education and Expertise
Danelle Tanner completed her BS in Physics/Math at the University of Louisiana at Lafayette between 1970 and 1976. She furthered her education at Texas A&M University, where she studied from 1976 to 1983. She has developed a specialized expertise in MEMS testing standards and predictive models for MEMS accelerated aging, focusing on reliability and packaging.
Background
Danelle Tanner has an extensive background in nuclear physics and radiation effects testing. This expertise has significantly contributed to her work in reliability physics. She brings a depth of knowledge to her role, leveraging her experience to push forward cutting-edge technologies in her field.
Past Experience at Sandia National Laboratories
In 1970, Danelle Tanner worked at Sandia National Laboratories in Albuquerque, New Mexico. Although her tenure there was quite brief, holding the title of Principal Member Technical Staff, her short stint adds to her diverse experience in the technical and scientific realms.