Nathan Young
About Nathan Young
Nathan Young is a Senior Member of the Technical Staff in Microsystems Integration at Sandia National Laboratories, with extensive experience in mechanical engineering and microsystems integration.
Current Role at Sandia National Laboratories
Nathan Young serves as a Senior Member of the Technical Staff in Microsystems Integration at Sandia National Laboratories in Albuquerque, New Mexico. He has been with Sandia since 2008, where he is involved in the mechanical integration of detector assemblies. His work includes focal plane arrays, read-out circuitry, cabling, and optics mounting.
Previous Experience at Georgia Institute of Technology
Nathan Young was a Graduate Research Assistant at the Georgia Institute of Technology from 2006 to 2008. During his tenure, he worked on various research projects as part of his graduate studies. His work here helped lay the foundation for his expertise in mechanical engineering.
Internships and Early Career
Nathan Young has had multiple internships that shaped his early career. In 2006, he worked as an Engineering Intern at Innovation Industries for 3 months. He also held an internship in 2003 at Cloyes Gear for 4 months. These early roles provided him with practical engineering experience that has been beneficial throughout his career.
Educational Background in Mechanical Engineering
Nathan Young studied Mechanical Engineering and achieved a Master of Science degree from Georgia Institute of Technology from 2006 to 2008. Prior to that, he earned a Bachelor of Science degree in Mechanical Engineering from Arkansas Tech University, where he studied from 2002 to 2006. His academic background has equipped him with the necessary skills and knowledge for his professional career.
Technical Contributions and Innovations
Nathan Young has made significant technical contributions in the field of microsystems integration. He redesigned a multi-chip module using ANSYS/Matlab thermal-structural simulation to extend component life and optimize package reliability. Additionally, he oversaw the development of a machine vision system capable of measuring micron-scale deformation, essential for verifying assembly and maintaining detector planarity under thermal mechanical loading. He has also implemented DfR Sherlock combined with Ansys Icepak for system-level electronic reliability prediction.