Onto Innovation
Onto Innovation provides metrology, defect inspection, lithography, and smart manufacturing software solutions for semiconductor manufacturers, supporting various markets with a global presence and comprehensive customer support.
Company Overview
Onto Innovation provides metrology, defect inspection, lithography, and smart manufacturing software solutions for semiconductor manufacturers. The company was formed from the merger of Nanometrics Incorporated and Rudolph Technologies, Inc. in October 2019. Headquartered in Wilmington, Massachusetts, Onto Innovation serves a diverse market including logic/foundry, memory, RF/MEMS, image sensors, advanced packaging, and flat panel displays, among others.
Global Presence
Onto Innovation has a significant global presence with locations spanning the USA, Europe, Singapore, Malaysia, Vietnam, China, Japan, Korea, and Taiwan. The company supports customers worldwide through an extensive sales and service organization, ensuring timely and efficient customer support and training programs. These training programs are based on the SEMI E150 Performance Based Equipment Training (PBET) standard.
Products and Solutions
Onto Innovation offers a wide range of products to address various manufacturing challenges in the semiconductor industry. Key products include the Element System for high-speed impurity mapping and epi thickness measurement, the NovusEdge G2 System for edge and backside inspection, the Atlas Series for advanced OCD and film metrology, and the Echo System for acoustic film metrology. Additional products like the IMPULSE Series, Aspect System, Dragonfly G3 System, JetStep X500 System, Discover Defect Software, and PrecisionWoRx VX4 System further enhance their comprehensive solutions for semiconductor manufacturing.
Technological Solutions
Onto Innovation's technological solutions span from incoming bare wafer inspection to final package, addressing complex process challenges faced by semiconductor manufacturers. Noteworthy systems include the Element S System designed for smaller 100mm to 200mm wafer sizes used in the SiC power device market and the Dragonfly G3 System for automated 2D/3D inspection and metrology. These solutions enable manufacturers to achieve greater visibility and cleaner operations in smart factory environments.
Market Applications
Onto Innovation's products are designed for various markets including bare wafer, logic/foundry, memory, RF/MEMS, image sensors, advanced packaging, LED/power, probe test, and flat panel display. The company's solutions like the Atlas Series, Echo System, and Aspect System cater to specific market needs, offering advanced metrology and inspection capabilities that help customers manage and optimize their semiconductor manufacturing processes effectively.